A modeling technique for CMOS gates

In this paper, a modeling technique for CMOS gates, based on the reduction of each gate to an equivalent inverter, is presented. The proposed method can be incorporated in existing timing simulators in order to improve their accuracy. The conducting and parasitic behavior of parallel and serially connected transistors is accurately analyzed and an equivalent transistor is extracted for each case, taking into account the actual operating conditions of each device in the structure. The proposed model incorporates short-channel effects, the influence of body effect and is developed for nonzero transition time inputs. The exact time point when the gate starts conducting is efficiently calculated improving significantly the accuracy of the method. A mapping algorithm for reducing every possible input pattern of a gate to an equivalent signal is introduced and the "weight" of each transistor position in the gate structure is extracted. Complex gates are treated by first mapping every possible structure to a NAND/NOR gate and then by collapsing this gate to an equivalent inverter. Results are validated by comparisons to SPICE and ILLIADS2 for three submicron technologies.

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