论文信息 - Measurement of composition in Hg1−xCdxTe epilayers

Measurement of composition in Hg1−xCdxTe epilayers

A new model has been presented for evaluating the composition distribution in both the transverse (perpendicular to the direction along the depth) and longitudinal (along the depth) directions in HgCdTe epitaxy materials by fitting room temperature transmission spectroscopy data.

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