Boundary scan test used at board level: moving towards reality

The author addresses the need for adapted design and test tools when using boundary scan in board-level circuit design and testing these assemblies. Test pattern generation is dealt with, the data flow around this generation software is discussed, and a format for test vectors is presented. Details are given for different approaches to test pattern generation, and a program for checking correctness of vectors is introduced. Also, a PC-based BST (boundary scan testing) validation tool capable of addressing the first needs of a designer is described. It is concluded that, although using BST pays off very rapidly, a lot of details in the total design and test trajectory have to be cleared up. Coupling between tools and availability of software capable of dealing with BST according to a selected strategy are items that have to be checked. >

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