Anomaly detection for IGBTs using Mahalanobis distance
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[1] R. W. De Doncker,et al. Reliability Prediction for Inverters in Hybrid Electrical Vehicles , 2007 .
[2] Guy Lefranc,et al. High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC , 2003, Microelectron. Reliab..
[3] M. Pecht,et al. Prognostics of ceramic capacitor temperature‐humidity‐bias reliability using Mahalanobis distance analysis , 2007 .
[4] Vijay K. Garg,et al. Prognostic and Warning System for Power-Electronic Modules in Electric, Hybrid Electric, and Fuel-Cell Vehicles , 2008, IEEE Transactions on Industrial Electronics.
[5] Michel Mermet-Guyennet,et al. IGBT module failure analysis in railway applications , 2008, Microelectron. Reliab..
[6] M. Pecht,et al. Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics , 2009, IEEE Transactions on Reliability.
[7] D. Massart,et al. The Mahalanobis distance , 2000 .
[8] Jerry L. Hudgins,et al. - Power Semiconductor Devices , 2018, The Electric Power Engineering Handbook - Five Volume Set.
[9] M. Held,et al. Fast power cycling test for insulated gate bipolar transistor modules in traction application , 1999 .
[10] Michael G. Pecht,et al. A prognostic approach for non-punch through and field stop IGBTs , 2012, Microelectron. Reliab..
[11] Bing Ji,et al. In Situ Diagnostics and Prognostics of Wire Bonding Faults in IGBT Modules for Electric Vehicle Drives , 2013, IEEE Transactions on Power Electronics.
[12] Mohammad Tariq Iqbal,et al. Reliability analysis of grid connected small wind turbine power electronics , 2009 .
[13] T. Martire,et al. Fast power cycling protocols implemented in an automated test bench dedicated to IGBT module ageing , 2015, Microelectron. Reliab..
[14] Tommy W. S. Chow,et al. Approach to Fault Identification for Electronic Products Using Mahalanobis Distance , 2010, IEEE Transactions on Instrumentation and Measurement.
[15] F.W. Fuchs,et al. Performance of diagnosis methods for IGBT open circuit faults in voltage source active rectifiers , 2004, 2004 IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551).
[16] Mohammed A. Alam,et al. Prognostics of Failures in Embedded Planar Capacitors using Model-Based and Data-Driven Approaches , 2011 .