Dynamic X-parameters*: Behavioral modeling in the presence of long term memory effects

An original way is presented to model memory effects of RF and microwave components by extending the X-parameter model. The approach can be used to model hard nonlinear behavior and long term memory effects and is valid for all possible modulation formats, for all possible peak-to-average ratios and for a wide range of modulation bandwidths. The model works for pulsed signals as well as for two-tone and multitone signals. The model has been validated by measurements and is compatible with existing harmonic balance simulators.

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