SECONDARY ELECTRON EMISSION PROPERTIES

Abstract In this paper an introduction is given to secondary electron emission properties. It is shown that the reduced secondary emission yield δ δ m as a function of the reduced primary energy E p E m can be described by a universal curve. It is found that it is easier to use the measurement of the maximum secondary electron emission δm and the energy Em at which this maximum is reached to determine the suitability of a coating for use in the display than direct measurement of the first crossover energy EI. The value of δm and Em can be used to derive EI. Furthermore, it is observed that in any material the elastic fraction of the secondary electrons exhibits a universal behaviour as a function of Ep. Fits to δ(Ep) and the energy distribution of the secondary electrons are proposed which can be used in Monte Carlo simulations.

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