Fundamentals of timing information for test: How simple can we get?
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[1] Haihua Yan,et al. Evaluating the effectiveness of detecting delay defects in the slack interval: a simulation study , 2004, 2004 International Conferce on Test.
[2] Weiping Shi,et al. K longest paths per gate (KLPG) test generation for scan-based sequential circuits , 2004, 2004 International Conferce on Test.
[3] Lawrence T. Pileggi,et al. TACO: timing analysis with COupling , 2000, Proceedings 37th Design Automation Conference.
[4] Chen Wang,et al. Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects , 2006, 2006 15th Asian Test Symposium.
[5] Janusz Rajski,et al. High-frequency, at-speed scan testing , 2003, IEEE Design & Test of Computers.
[6] Phil Nigh,et al. Test method evaluation experiments and data , 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).
[7] Jing Wang,et al. K longest paths per gate (KLPG) test generation for scan-based sequential circuits , 2004 .
[8] Ananta K. Majhi,et al. On hazard-free patterns for fine-delay fault testing , 2004 .
[9] L. H. Goldstein,et al. Controllability/observability analysis of digital circuits , 1978 .
[10] C. P. Ravikumar,et al. At-speed transition fault testing with low speed scan enable , 2005, 23rd IEEE VLSI Test Symposium (VTS'05).
[11] Andrew Ferko,et al. Low overhead delay testing of ASICs , 2004, 2004 International Conferce on Test.
[12] Jindrich Zejda,et al. General framework for removal of clock network pessimism , 2002, ICCAD 2002.
[13] Spyros Tragoudas,et al. A critical path selection method for delay testing , 2004, 2004 International Conferce on Test.
[14] Peivand F. Tehrani,et al. Deep sub-micron static timing analysis in presence of crosstalk , 2000, Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525).
[15] Nandakumar Nityananda Tendolkar. Analysis of Timing Failures Due to Random AC Defects in VLSI Modules , 1985, DAC 1985.
[16] Akshay Gupta,et al. Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis , 2006, 2006 IEEE International Test Conference.
[17] M. Ray Mercer,et al. Statistical delay fault coverage and defect level for delay faults , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.