Accelerated Life Testing With Semiparametric Modeling of Stress Effects

Accelerated life testing has been widely applied to obtain the reliability information of an asset (component) at use conditions when the component is highly reliable. In accelerated life testing, tested components are exposed to stress levels more severe than usual so that more component failures can be observed in a short period of time. Most existing statistical models assume a known parametric relationship between the lifetime (or lifetime characteristic) and accelerating stresses. In this paper, we propose semiparametric modeling for the relationship between the lifetime characteristic and accelerating stresses. The proposed model is suitable for both single and multiple accelerating stress cases. A maximum penalized likelihood estimation method is developed to estimate the model parameters. A simulation study is implemented to illustrate the performance of the proposed model, and a real-world case study is conducted to demonstrate the proposed model.

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