Reconstruction Of Surfaces Of 3-D Objects By M-array Pattern Projection Method

A common problem of Pattern projection methods to measure surfaces of 3-D objects is that an observed pattern possibly i ncludes disorders such as deficiency, d isplacement, and permutation of subpatterns. These disorders make it difficult to match observed patterns with its position on the projected one and cause wrong m easurements as a result. This paper proposes a new technique to correct pattern disorders by using a pattern made from an M-array which is a two-dimensional extension of a well-known M-sequence.