Selected Peer-Reviewed Articles from the 4th European Workshop on CMOS Variability, Karlsruhe, Germany, September 9-11, 2013

VARI 2013 was the fourth European workshop on CMOS Variability. The VARI meeting answers to the need to have a European event on variability, where industry and academia meet to discuss. VARI 2013 was organized by the Karlsruhe Institute of Technology (KIT), in Germany. The objective of VARI is to provide a forum to discuss and investigate the CMOS variability problems in methodologies and tools for the design of upcoming generations of integrated circuits and systems. The technical program focused on performance and power consumption as well as architectural aspects like adaptability or resilience, with particular emphasis on modeling, design, characterization, analysis and optimization of variability. A selection of papers on CMOS variability pr sented at VARI 2013 is included in this special section of JOLPE. The selection of the papers has been done based on the