Timing analysis for thermally robust clock distribution network design for 3D ICs

Three-dimensional Integrated Circuits provide a solution to overcome bottlenecks in performance and power management issues. However, the drawback arises in the form of increased thermal density that results in thermal gradients that affect signal integrity. Since, the clock signal is critical for ensuring the performance of synchronous digital systems, its design is very important. In this paper we analyze the effect of thermal gradient on the clock distribution networks in the context of 3D ICs. We also propose novel methods for compensating the thermal effects which have been validated through extensive simulations and preliminary hardware measurements.

[1]  C. Jahnes,et al.  2.5D and 3D technology challenges and test vehicle demonstrations , 2012, 2012 IEEE 62nd Electronic Components and Technology Conference.

[2]  Joungho Kim,et al.  Modeling and Analysis of a Power Distribution Network in TSV-Based 3-D Memory IC Including P/G TSVs, On-Chip Decoupling Capacitors, and Silicon Substrate Effects , 2012, IEEE Transactions on Components, Packaging and Manufacturing Technology.

[3]  Junho Lee,et al.  Vertical tree 3-dimensional TSV clock distribution network in 3D IC , 2012, 2012 IEEE 62nd Electronic Components and Technology Conference.

[4]  James Tschanz,et al.  Parameter variations and impact on circuits and microarchitecture , 2003, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).

[5]  Eby G. Friedman,et al.  Clock distribution networks in synchronous digital integrated circuits , 2001, Proc. IEEE.

[6]  H. Hasegawa,et al.  Properties of Microstrip Line on Si-SiO/sub 2/ System , 1971 .

[7]  Jianyong Xie,et al.  Fast electrical-thermal co-simulation using multigrid method for 3D integration , 2012, 2012 IEEE 62nd Electronic Components and Technology Conference.

[8]  X. Duan,et al.  Circular Ports in Parallel-Plate Waveguide Analysis With Isotropic Excitations , 2012, IEEE Transactions on Electromagnetic Compatibility.

[9]  Taigon Song,et al.  PDN Impedance Modeling and Analysis of 3D TSV IC by Using Proposed P/G TSV Array Model Based on Separated P/G TSV and Chip-PDN Models , 2011, IEEE Transactions on Components, Packaging and Manufacturing Technology.

[10]  A. Williamson Radial-line/coaxial-line junctions: analysis and equivalent circuits , 1985 .

[11]  Klaus-Dieter Lang,et al.  Application of the transverse resonance method for efficient extraction of the dispersion relation of arbitrary layers in silicon interposers , 2013, 2013 17th IEEE Workshop on Signal and Power Integrity.

[12]  Junho Lee,et al.  Distributed multi TSV 3D clock distribution network in TSV-based 3D IC , 2011, 2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems.

[13]  James D. Meindl,et al.  Temperature variable supply voltage for power reduction , 2002, Proceedings IEEE Computer Society Annual Symposium on VLSI. New Paradigms for VLSI Systems Design. ISVLSI 2002.

[14]  Xiaoxiong Gu,et al.  Efficient full-wave modeling of high density TSVs for 3D integration , 2010, 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC).

[15]  Jianyong Xie,et al.  Electrical-Thermal Co-Simulation of 3D Integrated Systems With Micro-Fluidic Cooling and Joule Heating Effects , 2011, IEEE Transactions on Components, Packaging and Manufacturing Technology.

[16]  Jun Fan,et al.  Physics-Based Via and Trace Models for Efficient Link Simulation on Multilayer Structures Up to 40 GHz , 2009, IEEE Transactions on Microwave Theory and Techniques.

[17]  Jun Fan,et al.  Accuracy of Physics-Based Via Models for Simulation of Dense Via Arrays , 2012, IEEE Transactions on Electromagnetic Compatibility.

[18]  Jan M. Rabaey,et al.  Digital Integrated Circuits , 2003 .

[19]  Paolo Maffezzoni,et al.  Lumped electro-thermal model of on-chip interconnects , 2006 .

[20]  Luca Benini,et al.  Dynamic Thermal Clock Skew Compensation using Tunable Delay Buffers , 2006, ISLPED'06 Proceedings of the 2006 International Symposium on Low Power Electronics and Design.

[21]  Junho Lee,et al.  High-Frequency Scalable Electrical Model and Analysis of a Through Silicon Via (TSV) , 2011, IEEE Transactions on Components, Packaging and Manufacturing Technology.