Comparative Analysis of Strain and Stress in MBE and MOCVD grown GaN thin films on sapphire
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C. Kisielowski | Z. Liliental-Weber | E. Weber | S. Rouvimov | M. Rubin | J. Krüger | E. Gertner | Y. Cho | R. Klockenbrink | G. Sudhir | D. Corlatan | R. Pittman | Viihwan Kim | Buraian Teii Makudaamotsuto