In-plane aligned YBCO tape on textured YSZ buffer layer deposited on NiCr alloy substrate by laser ablation with only O+ ion beam assistance

High critical current density and in-plane aligned YBa2Cu3O7-x (YBCO) films on textured yttria- stabilized zirconia (YSZ) buffer layers deposited on NiCr alloy (Hastelloy c-275) substrates by laser ablation with only O+ ion beam assistance were fabricated. The X- ray Phi-scan full width at half-maximums for YSZ (202) and YBCO (103) were 18 degree(s) and 11 degree(s) respectively. A critical current density of 7.9 X 105 A/cm2 of YBCO films was obtained at liquid nitrogen temperature and zero field. The critical temperature of the YBCO tape was 90 K.