Effects of oxidation on reliability of screen-printed silver circuits for radio frequency applications

Abstract High reliability has become one of the crucial requirements for portable electronic devices, due to the high dependence of their radio frequency (RF) characteristics on the end-user's surroundings. The RF characteristics of screen-printed silver (Ag) circuits were investigated after a steady-state temperature and humidity storage test. A conductive paste containing Ag nanoparticles was screen-printed onto a silicon (Si) substrate and then sintered at 250 °C for 30 min in air. The printed Ag circuits were placed in a chamber at 85 °C/85% relative humidity (RH) for various durations: 100, 300, 500, 1000 h. The microstructural evolution and thickness profiles of the Ag circuits were observed with field emission scanning electron microscopy and α-step, respectively. The oxidation of the printed Ag circuit surface was analyzed with Auger electron spectroscopy. A network analyzer and Cascade's probe system in the frequency range of 40 MHz to 40 GHz were employed to measure the scattering parameters of the Ag circuits. The experimental results showed that the insertion losses at higher frequencies increased with increasing durations of exposure to the 85 °C/85% RH environment, due to the thicker specific layer for oxidation on the circuit surfaces. The oxide layer was the dominant factor affecting the RF characteristics of the screen-printed Ag thin circuits. Therefore, it is essential to control the oxidation of printed circuits for versatile RF applications.