Nano-structure of transition-metal (Ti, Ni)/SiC system: photo-emission electron microscopy and soft X-ray fluorescence spectroscopy
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Kenichi Yoshida | A. Ohi | J. Labis | M. Iwami | C. Kamezawa | M. Hirai | M. Kusaka | Y. Morikawa
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Kenichi Yoshida | A. Ohi | J. Labis | M. Iwami | C. Kamezawa | M. Hirai | M. Kusaka | Y. Morikawa