Determination of Optical Constants from Reflectance or Transmittance Measurements on Bulk Crystals or Thin Films

The optical constants of bulk materials and thin films have been conveniently determined employing an automatic curve-fitting procedure to obtain a classical oscillator fit to reflectance and/or transmittance data. The method compares favorably in convenience and accuracy with a Kramers–Kronig analysis of bulk reflectivity spectra and is a better technique than the R,T or T,T methods presently used to analyze spectro-photometric data of thin films.