Boundary fitted coordinated generation for device analysis on composite and complicated geometries

A finite difference boundary fitted grid-generation method for composite and complicated geometries is described. In each region belonging to the domain of interest, a set of points is defined by differential transformation from a regular computational space, maintaining the continuity of coordinate lines crossing the internal boundaries. The definition of the relationship between the nodes yields a finite element mesh. Both the mathematical basis and the algorithmic implementation are shown, followed by an example of application to a realistic semiconductor device. >