Optimal Solution of Linear Inequalities with Applications to Pattern Recognition

An algorithm for the optimal solution of consistent and inconsistent linear inequalities is presented, where the optimality criterion is the maximization of the number of constraints satisfied. In the terminology of pattern recognition, the algorithm finds a linear decision function which minimizes the number of patterns misclassified. The algorithm is developed as a nonenumerative search procedure based on several new results established in this paper. Bounds on the search are also developed and the method is experimentally evaluated and shown to be computationally superior to other techniques for finding minimum-error solutions.

[1]  Julius T. Tou,et al.  Pattern Recognition Principles , 1974 .

[2]  Michael G. Thomason,et al.  Syntactic Pattern Recognition, An Introduction , 1978, IEEE Transactions on Pattern Analysis and Machine Intelligence.

[3]  Toshihide Ibaraki,et al.  Adaptive Linear Classifier by Linear Programming , 1970, IEEE Trans. Syst. Sci. Cybern..

[4]  FRED W. SMITH,et al.  Pattern Classifier Design by Linear Programming , 1968, IEEE Transactions on Computers.

[5]  Hai Do-Tu,et al.  Learning Algorithms for Nonparametric Solution to the Minimum Error Classification Problem , 1978, IEEE Transactions on Computers.

[6]  R. E. Warmack,et al.  An Algorithm for the Optimal Solution of Linear Inequalities and its Application to Pattern Recognition , 1973, IEEE Transactions on Computers.

[7]  Peter H. Mengert Solution of Linear Inequalities , 1970, IEEE Transactions on Computers.

[8]  Akihiko Miyake,et al.  Mathematical aspects of optimal linear discriminant function , 1979, COMPSAC.

[9]  R. Fisher THE USE OF MULTIPLE MEASUREMENTS IN TAXONOMIC PROBLEMS , 1936 .

[10]  丸山 徹 Convex Analysisの二,三の進展について , 1977 .

[11]  Shuichi Shinmura,et al.  Optimal linear discriminant functions and their application , 1979, COMPSAC.

[12]  Thomas M. Cover,et al.  Geometrical and Statistical Properties of Systems of Linear Inequalities with Applications in Pattern Recognition , 1965, IEEE Trans. Electron. Comput..

[13]  Thomas M. Cover,et al.  Geometrical andStatistical Properties ofSystems of Linear Inequalities withApplications inPattern Recognition , 1965 .