Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET
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D. Linten | B. Kaczer | G. Groeseneken | J. Franco | P. Roussel | Zhicheng Wu | B. Truijen
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D. Linten | B. Kaczer | G. Groeseneken | J. Franco | P. Roussel | Zhicheng Wu | B. Truijen