Toward a physical understanding of the reliability-limiting EC-0.57 eV trap in GaN HEMTs
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S. Keller | U. K. Mishra | D. W. Cardwell | S. A. Ringel | J. S. Speck | S. Ringel | U. Mishra | J. Speck | S. Keller | A. Arehart | A. Sasikumar | S. Kaun | J. Pelz | S. W. Kaun | J. Lu | D. Cardwell | J. Lu | A. Sasikumar | A. R. Arehart | J. P. Pelz | Umesh K. Mishra | Sarah L. Keller | Jiwei Lu | Jonathan P. Pelz
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