Recognition of track defects through measured acceleration using a recurrent neural network
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Sebastian Rapp | Yi Zhang | Jing Liu | Ullrich Martin | Sebastian Bahamon-Blanco | U. Martin | S. Rapp | Jing Liu | Yi Zhang | S. Bahamon-Blanco
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Sebastian Rapp | Yi Zhang | Jing Liu | Ullrich Martin | Sebastian Bahamon-Blanco | U. Martin | S. Rapp | Jing Liu | Yi Zhang | S. Bahamon-Blanco