Electron radiation impact on the kink effect in S 22 of InP-based high electron mobility transistors

In this paper, the effect of 1 MeV electron radiation on the kink effect in S 22 of InP-based high electron mobility transistors (HEMTs) has been comprehensively analyzed. The radiated fluence is varied among 1 × 1014 cm−2, 1 × 1015 cm−2 and 1 × 1016 cm−2. The size change of the kink effect before and after radiation is expressed by self-normalization and standard deviation. The results show that the kink effect appears at 36 GHz and becomes distinct in the sub-threshold region. The non-monotonous trend of the S 22 curve caused by the kink effect increases as the fluence increases. The dual-feedback circuit methodology is adopted to explain the influence of electron radiation on the kink effect; moreover, the change of transconductance and gate capacitance is the main reason for the influence of electron radiation on the kink effect in S 22. This research will provide theoretical guidance for InP-based HEMTs to be used in space radiation applications.

[1]  D. Nirmal,et al.  A critical review of design and fabrication challenges in InP HEMTs for future terahertz frequency applications , 2021 .

[2]  Spyridon Pavlidis,et al.  UV illumination effects on AlGaN/GaN HEMTs for tunable RF oscillators , 2021, 2021 IEEE Radio and Wireless Symposium (RWS).

[3]  Zhi Jin,et al.  Effect of 1 MeV electron irradiation on gate contact characteristics of InP-based HEMTs , 2020 .

[4]  Mengke Li,et al.  Enhancement of radiation hardness of InP-based HEMT with double Si-doped plane , 2020 .

[5]  Zhi Jin,et al.  An improved empirical nonlinear model for InP-based HEMTs , 2020 .

[6]  Zhi Jin,et al.  Degradation mechanisms of InP-based high-electron-mobility transistors under 1 MeV electron irradiation , 2020, Journal of Physics D: Applied Physics.

[7]  Zhi Jin,et al.  Effect of Electron Irradiation Fluence on InP-Based High Electron Mobility Transistors , 2019, Nanomaterials.

[8]  Daehyun Kim,et al.  Lg = 25 nm InGaAs/InAlAs high-electron mobility transistors with both fT and fmax in excess of 700 GHz , 2019, Applied Physics Express.

[9]  A. Jarndal Neural network electrothermal modeling approach for microwave active devices , 2019, International Journal of RF and Microwave Computer-Aided Engineering.

[10]  A. Rezazadeh,et al.  Thermal influence on S22 kink behavior of a 0.15 μm gate length AlGaN/GaN/SiC HEMT for microwave applications , 2019, Semiconductor Science and Technology.

[11]  C. Sarkar,et al.  InP high electron mobility transistors for submillimetre wave and terahertz frequency applications: A review , 2018, AEU - International Journal of Electronics and Communications.

[12]  C. Zhang,et al.  Proton Irradiation Effect on InP‐Based High Electron Mobility Transistor by Numerical Simulation with Non‐Uniform Induced Acceptor‐Like Defects , 2018 .

[13]  Zhi Jin,et al.  Effects of proton irradiation at different incident angles on InAlAs/InGaAs InP-based HEMTs* , 2018 .

[14]  Kiarash Ahi,et al.  Review of GaN-based devices for terahertz operation , 2017 .

[15]  Yasuhiro Nakasha,et al.  Maximum frequency of oscillation of 1.3 THz obtained by using an extended drain-side recess structure in 75-nm-gate InAlAs/InGaAs high-electron-mobility transistors , 2017 .

[16]  Emanuele Cardillo,et al.  Microwave effects of UV light exposure of a GaN HEMT: Measurements and model extraction , 2016, Microelectron. Reliab..

[17]  Antonio Raffo,et al.  Kink Effect in ${\rm S}_{22}$ for GaN and GaAs HEMTs , 2015, IEEE Microwave and Wireless Components Letters.

[18]  Antonio Raffo,et al.  An Extensive Experimental Analysis of the Kink Effects in ${ S}_{22}$ and ${ h}_{21}$ for a GaN HEMT , 2014, IEEE Transactions on Microwave Theory and Techniques.

[19]  F. Ren,et al.  Study on the effects of proton irradiation on the dc characteristics of AlGaN/GaN high electron mobility transistors with source field plate , 2014 .

[20]  Stephen J. Pearton,et al.  Review of radiation damage in GaN-based materials and devices , 2013 .

[21]  A. Caddemi,et al.  The Kink Phenomenon in the Transistor ${\rm S} _{22}$: A Systematic and Numerical Approach , 2012, IEEE Microwave and Wireless Components Letters.

[22]  T. Brazil,et al.  An Improved Small-Signal Parameter-Extraction Algorithm for GaN HEMT Devices , 2008, IEEE Transactions on Microwave Theory and Techniques.

[23]  Guang Chen,et al.  A low gate bias model extraction technique for AlGaN/GaN HEMTs , 2006, IEEE Transactions on Microwave Theory and Techniques.

[24]  G. Kompa,et al.  A new small-signal modeling approach applied to GaN devices , 2005, IEEE Transactions on Microwave Theory and Techniques.

[25]  Chinchun Meng,et al.  A novel interpretation of transistor S-parameters by poles and zeros for RF IC circuit design , 2001 .

[26]  Shey-Shi Lu,et al.  The origin of the kink phenomenon of transistor scattering parameter S/sub 22/ , 2001 .

[27]  Jin Zhi,et al.  A W-band high-gain and low-noise amplifier MMIC using InP-based HEMTs , 2015 .

[28]  Zhong Ying A W-band high-gain and low-noise amplifier MMIC using InP-based HEMTs , 2015 .

[29]  Yan Wang,et al.  A new small-signal modeling and extraction method in AlGaN/GaN HEMTs , 2008 .

[30]  Cor Claeys,et al.  Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle , 2001, Microelectron. Reliab..