An on-chip waveform capturing technique pursuing minimum cost of integration

An on-chip waveform capturing technique demonstrates 8.5 ENOB and 62.7 dB SFDR at 200 Ms/s for analog signals with 25-MHz bandwidth and 2.5 V rail-to-rail offset DC level, suitable for testing and self diagnosis of a mixed-signal chip. The area of 0.004mm2 in a 90 nm CMOS chip is only required for the integration of probing front end circuitry, with the help of an efficient discretization algorithm on a digital data processing chain involving on-chip logic paths, an off-chip 8 bit micro controller, and PC. Waveform acquisition at the system throughput of 1.9 transaction/point is achieved, by minimizing the number of slow-speed transactions between external measurement equipments and PC.

[1]  Gordon W. Roberts,et al.  A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits , 2002, IEEE J. Solid State Circuits.

[2]  Y. Yasu,et al.  In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution , 2006, IEEE Journal of Solid-State Circuits.

[3]  M. Nagata,et al.  On-Chip Analog Circuit Diagnosis in Systems-on-Chip Integration , 2006, 2006 Proceedings of the 32nd European Solid-State Circuits Conference.

[4]  T. Rahal-Arabi,et al.  On-die droop detector for analog sensing of power supply noise , 2004, IEEE Journal of Solid-State Circuits.

[5]  M. Nagata,et al.  A built-in technique for probing power supply and ground noise distribution within large-scale digital integrated circuits , 2005, IEEE Journal of Solid-State Circuits.

[6]  Atsushi Iwata,et al.  Measurements and analyses of substrate noise waveform inmixed-signal IC environment , 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[7]  M. Takamiya,et al.  An on-chip 100 GHz-sampling rate 8-channel sampling oscilloscope with embedded sampling clock generator , 2002, 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315).

[8]  Yu Zheng,et al.  On-chip oscilloscopes for noninvasive time-domain measurement of waveforms in digital integrated circuits , 2003, IEEE Trans. Very Large Scale Integr. Syst..

[9]  Toshiro Tsukada,et al.  Voltage-comparator-based measurement of equivalently sampled substrate noise waveforms in mixed-signal integrated circuits , 1996 .

[10]  M. Horowitz,et al.  Circuits and techniques for high-resolution measurement of on-chip power supply noise , 2004, IEEE Journal of Solid-State Circuits.

[11]  Ron Ho,et al.  Applications of on-chip samplers for test and measurement of integrated circuits , 1998, 1998 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.98CH36215).