Mechanism of leakage current increase in p-GaN gate AlGaN/GaN power devices induced by ON-state gate bias
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H. A. Moghadam | S. Dimitrijev | Baikui Li | P. Tanner | Jisheng Han | Jiannong Wang | Xi Tang | Hui Li
暂无分享,去创建一个
H. A. Moghadam | S. Dimitrijev | Baikui Li | P. Tanner | Jisheng Han | Jiannong Wang | Xi Tang | Hui Li