Computed laminography for materials testing

We have developed a computed laminography system for the inspection of large or flat objects using x rays. By this new laminographic method only a translation of the object is necessary. Both the x‐ray source and the detector remain stationary. Object cross sections are reconstructed from digital projections taken during the object motions and for the reconstruction well‐known algorithms are used. By use of a microfocus x‐ray tube and a line detector, objects can be inspected with a slice resolution of about 50 μm independent of the object size.