Analysis and modeling of small-signal bipolar transistor operation at arbitrary injection levels

In this paper a study of small-signal operation of bipolar transistors is presented. Firstly, we derive the governing equations and the associated boundary conditions which describe the small-signal minority carrier transport in the quasi-neutral base region at arbitrary injection levels. Analytical solutions of the transport equations are then discussed. A consequence of the linearity of the transport equations is that the minority carrier currents at the device terminals can be expressed in terms of infinite polynomials of the complex variable. It is then shown that all the hitherto proposed non-quasi-static (NQS) models can be simply obtained by different approximations of the general current expressions. As a consequence, the differences between the various models are clarified, and models previously developed for the low-injection regime are extended to high-injection conditions. The dependence of fundamental model parameters such as the transit time, the partitioning factor, etc., on the injection level is analyzed in detail, and a simple analytical formulation is proposed. Limitations of previous approaches are outlined. Finally, selected NQS models are compared.

[1]  J. Seitchik Comment on "One-Dimensional Non-Quasi-Static Models for Arbitrarily and Heavily Doped Quasi- Neutral Layers in Bipolar Transistors" , 1990 .

[2]  Niccolò Rinaldi,et al.  Modeling of small-signal minority-carrier transport in bipolar devices at arbitrary injection levels , 1998 .

[3]  J. Seitchik Comments, with reply, on "One-dimensional non-quasi-static models for arbitrarily and heavily doped quasi-neutral layers in bipolar transistors" by B. Wu and F. Lindholm , 1990 .

[5]  F. Klaassen,et al.  Compact transistor modelling for circuit design , 1990 .

[6]  H. Klose,et al.  The transient integral charge control relation—A novel formulation of the currents in a bipolar transistor , 1987, IEEE Transactions on Electron Devices.

[7]  N. Rinaldi Modeling of minority-carrier transport in semiconductor regions with position-dependent material parameters at arbitrary injection levels , 1996 .

[8]  Analytical relations for the base transit time and collector current in BJTs and HBTs , 1997 .

[9]  C. R. Selvakumar,et al.  The general transient charge control relation: a new charge control relation for semiconductor devices , 1991 .

[10]  W. M. Webster On the Variation of Junction-Transistor Current-Amplification Factor with Emitter Current , 1954, Proceedings of the IRE.

[11]  H. C. Poon,et al.  An integral charge control model of bipolar transistors , 1970, Bell Syst. Tech. J..

[12]  Charles Y. Wrigley,et al.  Fundamentals of semiconductor devices , 1965 .

[13]  E. Rittner Extension of the Theory of the Junction Transistor , 1954 .

[14]  Ibrahim M. Abdel-Motaleb,et al.  An analytical all-injection charge-based model for graded-base HBTs , 1991 .

[15]  N. Rinaldi Sidewall effects on maximum cutoff frequency and forward transit time in downscaled bipolar transistors , 1994 .

[16]  F. A. Lindholm,et al.  Comparison and extension of recent one-dimensional bipolar transistor models , 1988 .

[17]  B. L. Grung,et al.  Transistors : fundamentals for the integrated-circuit engineer , 1983 .

[18]  J. T. Winkel Extended charge-control model for bipolar transistors , 1973 .

[19]  H.C. de Graaff,et al.  New formulation of the current and charge relations in bipolar transistor modeling for CACD purposes , 1985, IEEE Transactions on Electron Devices.

[20]  J.A. Seitchik,et al.  An accurate bipolar model for large signal transient and ac applications , 1987, 1987 International Electron Devices Meeting.

[21]  J. Fossum,et al.  Partitioned-charge-based modeling of bipolar transistors for non-quasi-static circuit simulation , 1986, IEEE Electron Device Letters.

[22]  J. S. Hamel An accurate charge control approach for modeling excess phase shift in the base region of bipolar transistors , 1996 .

[23]  J. Lindmayer,et al.  The high-injection-level operation of drift transistors , 1961 .

[24]  F. A. Lindholm,et al.  One-dimensional all injection nonquasi-static models for arbitrarily doped quasi-neutral layers in bipolar junction transistors including plasma-induced energy-gap narrowing , 1990 .

[25]  I. Getreu,et al.  Modeling the bipolar transistor , 1978 .

[26]  Robert G. Meyer,et al.  Analysis and Design of Integrated Circuits , 1967 .

[27]  F. Lindholm,et al.  Numerical analysis and interpretation of the small-signal minority-carrier transport in bipolar devices , 1988 .

[28]  Chih-Tang Sah,et al.  The equivalent circuit model in solid-state electronics—III: Conduction and displacement currents , 1970 .

[29]  F. A. Lindholm,et al.  One-dimensional non-quasi-static models for arbitrarily and heavily doped quasi-neutral layers in bipolar transistors , 1989 .

[30]  Michael Schroter,et al.  Investigation of very fast and high-current transients in digital bipolar IC's using both a new compact model and a device simulator , 1995, IEEE J. Solid State Circuits.

[31]  J. S. Hamel,et al.  Transient base dynamics of bipolar transistors in high injection , 1994 .

[32]  F. A. Lindholm,et al.  Non-quasi-static models including all injection levels and DC, AC, and transient emitter crowding in bipolar transistors , 1991 .

[33]  D. E. Thomas,et al.  Junction Transistor Short-Circuit Current Gain and Phase Determination , 1958, Proceedings of the IRE.