High di/dt switching with thyristors

Two types of involute-structured SCRs, one with the amplifying gate shorted to the pilot gate (shorted devices), and the other with a normal gate arrangement (unshortened devices), were tested as closing switches in a PFN (pulse forming network). The shorted devices were able to switch larger anode currents at higher values of di/dt of the shorted devices. All energy losses in the shorted thyristors were less than the losses in the unshorted ones. The gate current amplitude had a strong direct relationship to the anode di/dt of the shorted devices. There seemed to be a very weak, if any, correlation between the gate current amplitude and the unshorted device di/dt. The gate pulse width has no measurable effect on the switching parameters. The results indicate that for high-current, narrow-pulse switching, the amplifying gate has a detrimental effect on the thyristor performance.<<ETX>>

[1]  Jerry L. Hudgins,et al.  Gating Effects on Thyristor Anode Current di/dt , 1987, IEEE Transactions on Power Electronics.

[2]  M.S. Adler,et al.  The dynamics of the thyristor turn-on process , 1980, IEEE Transactions on Electron Devices.

[3]  A.A. Jaecklin Two-dimensional model of a thyristor turn-on channel , 1982, IEEE Transactions on Electron Devices.

[4]  Jerry L. Hudgins,et al.  High di/dt Pulse Switching of Thyristors , 1987, IEEE Transactions on Power Electronics.

[5]  M.S. Adler Details of the plasma-spreading process in thyristors , 1980, IEEE Transactions on Electron Devices.