论文信息 - Analysis of Si and SiGe integrated optical devices

Analysis of Si and SiGe integrated optical devices

In this contribution we present the application of hybrid time-domain transmission line matrix-integral equation methods (TLM-IE) to the analysis of Si and SiGe integrated optic components. For many practical configurations, the standard methods of integrated optics, because of their validity condition, are not satisfy. Then a combined TLM-IE can be used to visualize and to understand the electromagnetic field behaviour. In this letter, the simulation results of optical devices are presented. Compared with the pure TLM method the hybrid TLM-IE requires a considerably reduced computational effort.

T. Rozzi | L. Pierantoni | A. Di Donato

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