论文信息 - Microstructural characterization of electrically failed conductive traces printed from Ag nanoparticle inks

Microstructural characterization of electrically failed conductive traces printed from Ag nanoparticle inks

Abstract Conductive traces printed from nanoparticle loaded silver inks failed due to the application of excessive electrical current. A non-homogeneous microstructure was observed in the vicinity of the failed region consisting of sintered particles, grains and melted particles indicating a significant amount of heat was transferred to the conductive trace, in some cases, resulting in substrate damage. A simple physical model describing the failure mechanisms is proposed.

Ryan B. Wicker | Eric MacDonald | David A. Roberson

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