论文信息 - Sub-picosecond aperture-uncertainty measurements [ADCs]

Sub-picosecond aperture-uncertainty measurements [ADCs]

Sub-picosecond aperture-uncertainty measurement is a challenge today in the test of state-of-the-art high-speed, high-resolution A/D converters used in digital receivers. This work describes the existing double-channel techniques and analyzes the measurement accuracy obtainable with the instrumentation available today. Experimental results are provided which validate theory.

Giovanni Chiorboli

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