Fit MC/DC for test case generation method based on binary tree

Software testing is an effective way to ensure software quality,but the process of testing is tedious and workload more. To explore efficient and reliable test case design approach is our goal has always been. As the logic complexity of aerospace products and the size of its software increased gradually. It need to improve the efficiency of test case design. Based on MC/DC the test cases is designed,it is not only improve the efficiency of test case design but also added to the test coverage. All that are more suitable for testing relatively complex logic software. Many of the current software testing tools have the ability to determine coverage of the test cases. It can assess whether the design of the test cases satisfy the MC/DC requirements. But the software testers need is the reverse thinking process. The paper presents the application of unique cause and masking principle design test cases. This method automatically generates test cases which satisfy the MC/DC requirements. This approach improves the efficiency of the design of the test case.