论文信息 - Mutual influence of elements in x-ray fluorescence analysis of thin bilayer Ni/Ge-systems - 字舞流文

Mutual influence of elements in x-ray fluorescence analysis of thin bilayer Ni/Ge-systems

A. Razuvaev | A. Ershov | N. I. Mashin | É. A. Chernyaeva | A. N. Tumanova

[1] K. Hirokawa,et al. Effect of backing metals in the X-ray fluorescence spectral analysis of metal films and its application , 1964 .