Uncorrelated multiple conductive filament nucleation and rupture in ultra-thin high-κ dielectric based resistive random access memory
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Nagarajan Raghavan | Michel Bosman | Kin Leong Pey | Dongkyu Cha | X. Wu | X. Wu | K. Pey | N. Raghavan | M. Bosman | D. Cha | Qingxiao Wang | Kun Li | Xixiang Zhang | Qingxiao Wang | Kun Li | Xixiang Zhang
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