Modeling of Subsurface Leakage Current in Low $V_{\mathrm {TH}}$ Short Channel MOSFET at Accumulation Bias
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C. Hu | Y. Chauhan | A. Medury | Yen-Kai Lin | S. Khandelwal | H. Agarwal | Huan-Lin Chang
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C. Hu | Y. Chauhan | A. Medury | Yen-Kai Lin | S. Khandelwal | H. Agarwal | Huan-Lin Chang