论文信息 - On the characterisation of grown-in defects in Czochralski-grown Si and Ge - 字舞流文

On the characterisation of grown-in defects in Czochralski-grown Si and Ge

M. Meuris | P. Roussel | W. Geens | J. Vanhellemont | F. Holsteyns | P. Śpiewak | J. Steenbergen | I. Romandic | K. Młynarczyk