论文信息 - Photoemission study of the SiO2/Si interface structure of thin oxide films on Si(100), (111), and (110) surfaces - 字舞流文

Photoemission study of the SiO2/Si interface structure of thin oxide films on Si(100), (111), and (110) surfaces

M. Niwano | A. Hiraiwa | Y. Takakuwa | K. Yagi | N. Miyamoto | Y. Takeda | Hitoshi Katakura