Polarization effects on gate leakage in InAlN/AlN/GaN high-electron-mobility transistors

Lattice-matched InAlN/AlN/GaN high electron mobility transistors offer high performance with attractive electronic and thermal properties. For high-voltage applications, gate leakage currents under reverse bias voltages remain a serious challenge. This current flow is dominated by field enhanced thermal emission from trap states or direct tunneling. We experimentally measure reverse-bias gate leakage currents in InAlN/AlN/GaN transistors at various temperatures and find that the conventional trap-assisted Frenkel-Poole model fails to explain the experimental data. Unlike the non-polar semiconductors Si, Ge, large polarization-induced electric fields exist in III-nitride heterojunctions. When the large polarization fields are accounted for, a modified Frenkel-Poole model is found to accurately explain the measured data at low reverse bias voltages. At high reverse bias voltages, we identify that the direct Fowler-Nordheim tunneling mechanism dominates. The accurate identification of the gate leakage curren...

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