论文信息 - Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge

Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge

Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

Ramesh Karri | Wenjing Rao | Alex Orailoglu | Chengmo Yang

[1] Alex Orailoglu,et al. Frugal but flexible multicore topologies in support of resource variation-driven adaptivity , 2011, 2011 Design, Automation & Test in Europe.

[2] Clemens J. M. Lasance. Thermally driven reliability issues in microelectronic systems: status-quo and challenges , 2003, Microelectron. Reliab..

[3] André DeHon,et al. Nanowire-based programmable architectures , 2005, JETC.

[4] Jianbo Gao,et al. Toward hardware-redundant, fault-tolerant logic for nanoelectronics , 2005, IEEE Design & Test of Computers.

[5] Konstantin Nikolic,et al. A short review of nanoelectronic architectures , 2004 .

[6] Massoud Pedram,et al. Architectures for silicon nanoelectronics and beyond , 2007, Computer.

[7] Ramesh Karri,et al. Logic Mapping in Crossbar-Based Nanoarchitectures , 2009, IEEE Design & Test of Computers.