Time-dependent crack behavior in an integrated structure
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J. Liang | Z. Zhang | J. H. Prévost | Z. Suo | Z. Suo | J. Prévost | J. Liang | Z. Zhang
[1] James P. Godschalx,et al. Development of a Low‐Dielectric‐Constant Polymer for the Fabrication of Integrated Circuit Interconnect , 2000 .
[2] Sigurd Wagner,et al. Failure resistance of amorphous silicon transistors under extreme in-plane strain , 1999 .
[3] Ted Belytschko,et al. A finite element method for crack growth without remeshing , 1999 .
[4] C. K. Inoki,et al. Strain relaxation of SiGe islands on compliant oxide , 2002 .
[5] Z. Suo,et al. Evolving crack patterns in thin films with the extended finite element method , 2003 .
[6] Zhigang Suo,et al. Thin film cracking modulated by underlayer creep , 2003 .
[7] Brian Lawn,et al. Fracture of brittle solids: Atomic aspects of fracture , 1993 .
[8] Z. Suo,et al. Kinetics of crack initiation and growth in organic-containing integrated structures , 2003 .
[9] Fritz J. Kub,et al. Compliant substrates: A comparative study of the relaxation mechanisms of strained films bonded to high and low viscosity oxides , 2000 .
[10] Zhigang Suo,et al. Loss of constraint on fracture in thin film structures due to creep , 2002 .
[11] Anthony G. Evans,et al. Mechanisms controlling the durability of thermal barrier coatings , 2001 .
[12] Q. Ma,et al. Channel Cracking Technique for Toughness Measurement of Brittle Dielectric Thin Films on Silicon Substrates , 1998 .
[13] Z. Suo,et al. Plastic ratcheting induced cracks in thin film structures , 2002 .
[14] J. Hutchinson,et al. Crack patterns in thin films , 2000 .
[15] J. Månson,et al. Adhesion of silicon oxide layers on poly(ethylene terephthalate). I: effect of substrate properties on coating's fragmentation process , 1997 .
[16] J. Prévost,et al. Modeling quasi-static crack growth with the extended finite element method Part I: Computer implementation , 2003 .