论文信息 - Precursor ion damage and angular dependence of single event gate rupture in thin oxides - 字舞流文

Precursor ion damage and angular dependence of single event gate rupture in thin oxides

Martin L. Green | G. L. Hash | L. P. Schanwald | D. Fleetwood | P. Dodd | B. Weir | P. Silverman | M. Shaneyfelt | F. Sexton | K. S. Krisch | R. A. Loemker | K. Krisch