Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films
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J. Woicik | Yongfeng Hu | A. Hitchcock | M. Martinson | J. Baribeau | S. Urquhart | Q. Xiao | M. Masnadi | Shaylin Eger | W. Cao