Determination of crystallographic polarity of CdTe crystals with Auger electron spectroscopy

The crystallographic polarity of CdTe crystals has been studied with Auger electron spectroscopy. The polarity of various surfaces could be determined by normalizing the low‐energy Te (NOO) peak with the high‐energy Te (MNN) peak. Upon comparing the normalized ratios from both {111} surfaces, the ratio from (111) Te surfaces was found to be about 1.3 times that from (111) Cd surfaces. The identified polarity was consistent with recent results of anomalous absorption of x rays, the convergent beam method of transmission electron microscopy, and chemical etching. Air‐cleaved {110} surfaces of CdTe crystals and surfaces of pure Te crystals were studied for comparison as well.

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