Electromagnetic characterization of layered materials via direct and de-embed methods
暂无分享,去创建一个
[1] Stanislaw S. Stuchly,et al. A Combined Total Reflection-Transmission Method in Application to Dielectric Spectroscopy , 1978, IEEE Transactions on Instrumentation and Measurement.
[2] G F. Engen,et al. Through-Load-Delay: An Improved Technique for Calibrating theDual Six-Port Automatic Network Analyzer , 1979 .
[3] A. C. Lynch. Precise Measurements on Dielectric and Magnetic Materials , 1974 .
[4] W. Barry,et al. A Broad-Band, Automated, Stripline Technique for the Simultaneous Measurement of Complex Permittivity and Permeability , 1986 .
[5] Arlette Fourrier-Lamer,et al. Broad-band simultaneous measurement of complex permittivity and permeability using a coaxial discontinuity , 1990 .
[6] Ramon Gonzalo,et al. Measurement of the dielectric constant and loss tangent of high dielectric-constant materials at terahertz frequencies , 2003 .
[7] Leo P. Ligthart,et al. A Fast Computational Technique for Accurate Permittivity Determination Using Transmission Line Methods , 1983 .
[8] Langis Roy,et al. Material characterization using a quasi-optical measurement system , 2002, Conference Digest Conference on Precision Electromagnetic Measurements.
[9] J. E. Gray,et al. Measurement and Standardization of Dielectric Samples , 1962 .
[10] Vicente E. Boria,et al. Characterization of complex permittivity properties of materials in rectangular waveguides using a hybrid iterative method , 2000 .
[11] A. M. Nicolson,et al. Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques , 1970 .
[12] A. von Hippel,et al. A New Method for Measuring Dielectric Constant and Loss in the Range of Centimeter Waves , 1946 .
[13] A. Enders. An accurate measurement technique for line properties, junction effects, and dielectric and magnetic material parameters , 1989 .
[14] Kamal Sarabandi,et al. Technique for measuring the dielectric constant of thin materials , 1988 .
[15] Chih-Wei Chang,et al. Nondestructive determination of electromagnetic parameters of dielectric materials at X-band frequencies using a waveguide probe system , 1997 .
[16] S. Ramo,et al. Fields and Waves in Communication Electronics , 1966 .
[17] V. Varadan,et al. A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies , 1989 .
[18] J. A. Jargon,et al. Complex permittivity determination from propagation constant measurements , 1999 .
[19] C. C. Courtney,et al. Time-domain measurement of the electromagnetic properties of materials , 1998 .
[20] A. G. Mungall,et al. MEASUREMENT OF THE COMPLEX DIELECTRIC CONSTANT OF LIQUIDS AT CENTIMETER AND MILLIMETER WAVELENGTHS , 1957 .
[21] J. King,et al. THE MEASUREMENT OF DIELECTRIC CONSTANTS. , 1921 .
[22] R. Collin. Field theory of guided waves , 1960 .
[23] Stuchly,et al. DIELECTRIC PROPERTIES OF BIOLOGICAL SUBSTANCES–TABULATED , 1980 .
[24] Jr. W.R. Scott. A new technique for measuring the constitutive parameters of planar materials , 1992 .
[25] R. Clarke,et al. The measurement of the properties of materials , 1986, Proceedings of the IEEE.
[26] L. J. Buckley,et al. Dielectric material measurement of thin samples at millimeter wavelengths , 1992 .
[27] W. De Raedt,et al. Two new measurement methods for explicit determination of complex permittivity , 1998 .
[28] W. Weir. Automatic measurement of complex dielectric constant and permeability at microwave frequencies , 1974 .
[29] G. F. Engen,et al. Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer , 1979 .
[30] E. J. Vanzura,et al. Improved technique for determining complex permittivity with the transmission/reflection method , 1990 .
[31] Prasad K. Kadaba. Simultaneous Measurement of Complex Permittivity and Permeability in the Millimeter Region by a Frequency-Domain Technique , 1984, IEEE Transactions on Instrumentation and Measurement.
[32] Dennis P. Nyquist,et al. An improved de-embedding technique for the measurement of the complex constitutive parameters of materials using a stripline field applicator , 1993 .
[33] Magdy F. Iskander,et al. Permittivity Measurements at Microwave Frequencies Using Lumped Elements , 1974 .
[34] H. E. Bussey,et al. Measurement of RF properties of materials a survey , 1967 .