IRT: A modeling system for single event upset analysis that captures charge sharing effects

IRT (Intel Radiation Tool), a GEANT4 based simulation system for the analysis of radiation-induced single event upsets that accounts for charge sharing effects is described. The capabilities and accuracy of the introduced simulation system are demonstrated against measured results for standard and reduced SER devices, focusing on Reinforcing Charge Collection (RCC) devices. Finally, the physical design space for optimizing soft error rates of RCC and Single Event Upset Tolerant (SEUT) devices is explored.

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