Band offsets of HfO2∕GeON∕Ge stacks measured by ultraviolet and soft x-ray photoelectron spectroscopies
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J. Hartmann | L. Vandroux | V. Loup | L. Clavelier | E. Martinez | C. Licitra | O. Renault | C. L. Royer | M. Guittet | N. Barrett | T. Veyron | L. Fourdrinier