A study on the Raman spectra of Al-doped and Ga-doped ZnO ceramics

Abstract Al x Zn 1− x O and Ga y Zn 1− y O ceramics were synthesized through a solid-state reaction technique. The crystal phase of the samples was identified by an X-ray diffraction experiment. For each sample, the electrical resistivity was determined. The Al 2-mol%-doped and Ga 0.5-mol%-doped ZnO ceramics had the lowest resistivity. Raman measurement was performed to study the doping effects in the ZnO ceramics including ZnO single crystal as a reference. The line-shape parameters, q 1 and Γ 1 , at the same certain doping rate and the solubility limit of Al (2 mol%) and Ga (0.5 mol%) in ZnO ceramics, are strongly related to the each other, and that the solubility limit plays an important role. The second-order Raman peak at 1162 cm −1 of the ZnO ceramics was fitted by Fano formalism. The Fano’s fitting parameters, such as the lifetime of phonon and the degree of asymmetry degree of the second-order Raman peak changed as the amounts of dopants were varied.

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