Monte Carlo simulations of scattering and emission from lossy dielectric random rough surfaces using the wavelet transform method

Recently, a fast computational technique based on the banded-matrix iterative approach/canonical grid (BMIA/CG) method has been developed for the analysis of random rough surfaces. However, there are situations that the matrix-vector multiplication associated with strong near-field interactions may dominate the CPU and memory storage requirement. In this paper, the wavelet transform method in conjunction with a screening window scheme is used to address these problems. It is noted that the wavelet-transformed matrix for each submatrix is implemented only once for different incident polarizations. Based on the idea of multiresolution analysis, the matrix-vector multiplication in an iterative solver is then efficiently evaluated for its higher sparsity. Numerical simulations are then used to study scattering and emission from the lossy dielectric random rough surfaces. All the four Stokes parameters are calculated in this paper.

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