论文信息 - Influence of the Pt barrier on Ti/Al/Pt/Au ohmic contacts to n-GaN studied by Rutherford backscattering spectrometry and x-ray diffraction - 字舞流文

Influence of the Pt barrier on Ti/Al/Pt/Au ohmic contacts to n-GaN studied by Rutherford backscattering spectrometry and x-ray diffraction

Z. J. Yang | Z. Z. Chen | X. D. Hu | G. Y. Zhang | L. S. Yu | S. Yao | C. Y. Hu | Y. Wang | T. Yu | C. Hu | Z. Ding | Z. Qin | Z. Yang | G. Zhang