A model for filament growth and switching in amorphous oxide films
暂无分享,去创建一个
[1] C. H. Sie. Electron microprobe analysis and radiometric microscopy of electric field induced filament formation on the surface of AsTeGe glass , 1970 .
[2] S. Ovshinsky,et al. Conduction and switching phenomena in covalent alloy semiconductors , 1970 .
[3] G. Dearnaley. A theory of the oxide-coated cathode , 1969 .
[4] T. Sugano,et al. Ordered Structure and Ion Migration in Silicon Dioxide Films , 1968 .
[5] J. Simmons,et al. A thin film, cold cathode, alpha-numeric display panel , 1968 .
[6] F. L. Worthing. D‐C Dielectric Breakdown of Amorphous Silicon Dioxide Films at Room Temperature , 1968 .
[7] G. Dearnaley. Electronic conduction through thin unsaturated oxide layers , 1967 .
[8] J. G. Simmons,et al. Forming process in evaporated SiO thin films , 1967 .
[9] F. Berz,et al. Low frequency noise in MOS field effect transistors , 1967 .
[10] S. R. Hofstein. SPACE‐CHARGE‐LIMITED IONIC CURRENTS IN SILICON DIOXIDE FILMS , 1967 .
[11] A. Revesz. Noncrystalline Structure and Electronic Conduction of Silicon Dioxide Films , 1967 .
[12] S. R. Hofstein. An investigation of instability and charge motion in metal-silicon oxide-silicon structures , 1966 .
[13] A. S. Grove,et al. Ion Transport Phenomena in Insulating Films , 1965 .
[14] W. E. Beadle,et al. Switching properties of thin Nio films , 1964 .
[15] T. W. Hickmott. Potential Distribution and Negative Resistance in Thin Oxide Films , 1964 .
[16] William A. Pliskin,et al. Stabilization of SiO2 Passivation Layers with P2O5 , 1964, IBM J. Res. Dev..
[17] T. W. Hickmott. Impurity Conduction and Negative Resistance in Thin Oxide Films , 1964 .
[18] P. Siffert,et al. Rectifying Process in Surface Barrier Detectors , 1964 .
[19] W. Feibelman,et al. Electron Emission from Thin Al‐Al2O3‐Au Structures , 1962 .
[20] T. W. Hickmott. LOW-FREQUENCY NEGATIVE RESISTANCE IN THIN ANODIC OXIDE FILMS , 1962 .