Bias assisted scanning probe microscopy direct write lithography enables local oxygen enrichment of lanthanum cuprates thin films
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Sergei V. Kalinin | R. Vasudevan | V. Foglietti | S. Jesse | E. Strelcov | I. Kravchenko | M. Okatan | C. Aruta | N. Yang | Francesco Lavini | G. Balestrino | D. Di Castro